Figure 2

Power dependence. Internal quality factor \(Q_{i}\) as a function of average photon number \(\langle n_{\mathrm{ph}}\rangle \) in the resonator. The solid lines are fits to Eq. (3), assuming two level fluctuators as the dominating leakage mechanism at low photon numbers. For each dielectric configuration, as encoded by the color according to Fig. 1b), data for the two resonators with minimal \(\vert Q_{\mathrm{TLS}}-Q_{c} \vert \) are plotted. Different symbols correspond to different resonators