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Table 1 Mechanical measurement results. Samples A1 through M3 have spacers unless noted otherwise. Samples N1 through N4 have no spacers. \(p_{\mathrm{b}}\): bonding pressure, \(c - t_{\mathrm{w,est}}\): fit plane height minus estimated wafer thickness (from independent measurements), θ: fit plane polar angle, ϕ: fit plane azimuthal angle

From: Improved parameter targeting in 3D-integrated superconducting circuits through a polymer spacer process

Name

\(p_{\mathrm{b}}\)

\(c - t_{\mathrm{w},\mathrm{est}}\)

θ

ϕ

Note

(N/mm2)

(μm)

(μrad)

(rad)

A1

20

10.37

88.0

5.79

 

A2

20

9.32

57.7

5.72

 

A3

20

9.01

160.9

5.83

Partially delaminated spacers

B1

20

10.09

45.2

5.71

 

B2

20

9.68

74.7

5.77

 

C1

20

10.72

88.0

6.28

 

D1

20

10.18

75.7

5.42

 

M1

10

9.54

64.6

0.69

 

M2

20

8.30

29.7

0.44

 

M3

40

8.39

163.2

1.06

 

N1

20

5.51

376.1

6.23

 

N2

10

8.89

180.1

0.62

 

N3

20

3.98

76.9

6.03

 

N4

40

4.69

502.6

0.40