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EPJ Quantum Technology

Table 2 Summary of the extracted relative permittivities \(\pmb{\epsilon _{\mathrm{r}}}\) and loss tangents tan δ of the tested dielectric materials

From: Characterizing the attenuation of coaxial and rectangular microwave-frequency waveguides at cryogenic temperatures

T/parameter

Micro-Coax LD PTFE

Keycom ldPTFE

Micro-Coax sPTFE

\(\epsilon_{\mathrm{r}}\)

RT

1.70 ± 0.01

1.72 ± 0.06

1.98 ± 0.07

4K

1.70 ± 0.01

1.72 ± 0.06

2.01 ± 0.07

BT

1.70 ± 0.01

1.72 ± 0.06

2.01 ± 0.07

tanδ [×10−5]

RT

9 ± 1

 

25 ± 4

4K

8.5 ± 0.2

0.8 ± 0.2

22 ± 2

BT

6.6 ± 0.2

0.7 ± 0.1

19 ± 4

  1. The methods used for the extraction of these parameters are discussed in the text.
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