Figure 3
From: Repeated radiation damage and thermal annealing of avalanche photodiodes
Dark count rates measured on DM1 after each irradiation and annealing for increasing cumulative proton radiation fluence. All characterizations are performed at a detector temperature of −80∘C. Following each incremental irradiation, DM1 is thermally annealed at +80∘C for one hour. In general, dark count rates are found to increase after each incremental irradiation and decrease after each annealing. Uncertainties, quantified by one standard deviation of Poissonian dark counts about the observed value, are smaller than the size of the marker symbols used in the graph