Figure 8
From: Repeated radiation damage and thermal annealing of avalanche photodiodes
Post-annealing dark count rates dependence on annealing duration. The dark count rate was measured immediately following irradiation to the \(6\times 10^{9}\)Â p/cm2 cumulative fluence, again after 20Â min of annealing, and finally again after a further 40Â min, for 60Â min total annealing time (the cumulative time is shown here). The observed dark count reduction is considerably more significant in the first 20Â min